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3G 3dbi 小磁座天線(CY3000-30110L02M-SMA)

[:zh]Product Drawing:

Mechanical properties:

Electrical properties:

Test Data:

Reliable test:

Test Item Procedure Requirement
1. Hi-Low Temperature Test -40°C (30minutes) to 90°C (30minutes); 24 cycles After 2 hours recovery:
1. no visible damage
2. Freq. Tol. : < ±5%
2. Damp heat Test 24hours at 60°C 90~95%RH After 2 hours recovery
1. No visible damage
2. Freq. Tol.:<± 5%
3. High temperature storage 24 hours at 90°C After 2 hours recovery:
1. no visible damage
2. Freq. Tol. : < ±5%
4. Endurance 30 cycles at a speed 25±3mm/minutes
along the mating by the push-on/pull-off machine
After 2 hours recovery:
1. no visible damage
2. Freq Tol.: < ±5%

[:en]Product Drawing:

Mechanical properties:

Electrical properties:

Test Data:

Reliable test:

Test Item Procedure Requirement
1. Hi-Low Temperature Test -40°C (30minutes) to 90°C (30minutes); 24 cycles After 2 hours recovery:
1. no visible damage
2. Freq. Tol. : < ±5%
2. Damp heat Test 24hours at 60°C 90~95%RH After 2 hours recovery
1. No visible damage
2. Freq. Tol.:<± 5%
3. High temperature storage 24 hours at 90°C After 2 hours recovery:
1. no visible damage
2. Freq. Tol. : < ±5%
4. Endurance 30 cycles at a speed 25±3mm/minutes
along the mating by the push-on/pull-off machine
After 2 hours recovery:
1. no visible damage
2. Freq Tol.: < ±5%

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